Phase modulation ellipsometer

32 PM multichannel acquisition at 32 wavelenght

Spectroscopic analysis: 32pts every 12s

Dynamic: a full scan ( 200nm - 650nm) takes 50 ms

Xenon lamp: 190nm - 850nm

Thermally regulated chuck: -60°C up to 200°C

Goniometer: 55° up to 85°

In situ UV irradiation for UV curable resist monitoring

Equipments

Characterization tools

Centre National de la Recherche Scientifique

Université Joseph Fourier

Institut National Polytechnique de Grenoble

commissariat à l'Energie Atomique